Antes (Beijing) Measurement and Control Technology Co., Ltd
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    Unit 05, 3rd Floor, Building 16, No. 8 Liangshuihe Second Street, Beijing Economic and Technological Development Zone
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Mal roughness tester XR20
Mal roughness tester XR20
Product details

MarSurf XR 20 is the most perfect top-level surface measurement instrument, and the computer can provide surface measurement parameters that meet international standards for testing rooms and production sites.

The high-performance MarSurf XR 20 is a measurement device developed by Mahr based on decades of experience in surface metrology research, combined with future developments

Can provide information based on ISO/JIS/ASME or MOTIF (ISO 12085)
Standard measurement R, P, More than 100 parameters of the W contour
Monitoring tolerances and statistical analysis of all parameters
• Use demonstration mode to quickly program in Quick&Easy
• Comprehensive accounting records
Automatically select the filtering method and sampling length that meet the standards (patent)
• Support different Ra or Rz evaluation methods (static/dynamic)
• Adjustable service and calibration cycles
Simulated measurement mode can help customers become more familiar with software measurement faster
Multiple configurations meet different application requirements
• Users with different permissions can be set
Flexible system can configure other spare parts and establish customer specified parameters
Different user settings with different permissions can avoid erroneous operations and ensure that unauthorized personnel cannot use the instrument
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